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Notice of retraction
Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
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Sensors and Materials, Volume 33, Number 7(1) (2021)
Copyright(C) MYU K.K.
pp. 2299-2310
S&M2618 Research Paper of Special Issue
https://doi.org/10.18494/SAM.2021.3277
Published: July 6, 2021

Deep Convolutional Neural Network for Coffee Bean Inspection [PDF]

Ping Wang, Hsien-Wei Tseng, Tzu-Ching Chen, and Chih-Hsien Hsia

(Received December 31, 2020; Accepted May 17, 2021)

Keywords: lightweight explainable coffee bean quality testing system, convolutional neural network, knowledge distillation

Coffee is one of the most popular drinks in the world. It contains antioxidants and health-promoting nutrients that can boost one’s energy and focus. However, defective beans mixed in with raw beans can easily affect the flavor and even be harmful to human health. The traditional human visual inspection of defective beans is extremely laborious and time-consuming and may result in low-quality coffee due to worker stress and fatigue. We propose a lightweight and explainable intelligent coffee bean quality inspection system that uses deep learning (DL) and computer vision (CV) technologies to assist operators in detecting defects, including mold, fermentation, insect bites, and crushed beans. We use knowledge distillation (KD) to achieve model compression. The basic explainable convolutional neural network (CNN) model is established using the explainable AI (XAI) method. The implemented system has a high identification rate, low complexity, and low power consumption, and can explain the judgment criteria of the complex classification model.

Corresponding author: Ping Wang, Hsien-Wei Tseng


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Cite this article
Ping Wang, Hsien-Wei Tseng, Tzu-Ching Chen, and Chih-Hsien Hsia, Deep Convolutional Neural Network for Coffee Bean Inspection, Sens. Mater., Vol. 33, No. 7, 2021, p. 2299-2310.



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